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  Scanning electron microscopy (SEM)coupled with EDX microanalyses
SEM + microanalyses EDX

SEM allows to investigate sample in a broad range of magnification (about 30x up to 100’000x) with an impressive depth of focus, in topographic as well as chemical contrast.
 

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Failures analysis and fractography

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Cleanliness assessment

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Microstructure examination of metals and ceramics

The EDX microanalysis feature allow to identify chemical elements from carbon up globally or locally, down to about one square micrometer. Furthermore, semi quantitative and quantitative compositions can be obtained in a simple, quick procedure.

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Determination of the nature of surface contaminations

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Identification of phases or inclusions in bulk materials

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Investigation on coating composition on cross sections

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Identification of particles or contaminant on surfaces

Gold line scan on electroplated gold coating

Line scan position (arrow)

 

Point analysis in zirconia after spectral cartography aquisition

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About nickel : 

- Nickel allergy
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